Agenda of the Laws and Regulations Committee Ken Butcher

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Specifications	Agenda of the Laws and Regulations Committee Ken Butcher
Business section

NTEP 2010 Final Report NTEP - 4 A 2 CD of B 3 and a 1 CD of the combined B 10 revision were distributed to TC 3/SC 5 “C

Specifications	Agenda of the Laws and Regulations Committee Ken Butcher
Outline	Table of Contents - Annual Report of the 95th NCMW NTEP 2010 Final Report 500 INTRODUCTION Table of Contents 500-1 I Mutual Recognition Arrangement (MRA) 500-2 I Mutual Acceptance Arrangement (MAA) 500-3 I NTEP Participating Laboratories and Evaluations Reports 500-4 I National Type Evaluation Technical Committee (NTETC) Sector Reports 500-5 I Conformity Assessment Program 500-6 I NTEP Contingency – NCWM NTEP Laboratory NTEP 2010 Final Report Appendix A – NTETC Grain Analyzer Sector NTEP Committee 2010 Final Report Appendix B – NTETC Measuring Sector NTEP 2010 Final Report Appendix C – NTETC Weighing Sector NTEP Committee 2010 Final Report Appendix D – NTETC Software Sector NTEP 2010 Final Report Appendix E − NTETC Belt-Conveyor Scale Sector NTEP 2010 Final Report Appendix F – Industry for a Better NTEP NTEP Committee 2010 Final Report Appendix G – Industry Letters: Verified Conformity Assessment Program NTEP Committee 2010 Final Report Appendix H – NTEP Initial Verification Report Form
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Content	NTEP 2010 Final Report NTEP - 4 A 2 CD of B 3 and a 1 CD of the combined B 10 revision were distributed to TC 3/SC 5 “Conformity assessment” in December 2009. Comments were requested by April 30, 2010, in advance of a TC 3/SC 5 meeting planned for October 2010. A meeting of the MAA Committee on Participation Review (CPR) was held in June 2009 in Berne, Switzerland. The NCWM was represented at the CPR meeting by Mr. Jim Truex. Dr. Charles Ehrlich and Mr. John Barton of NIST also attended the meeting as Secretariats of OIML TC 3/SC 5 “Conformity assessment” and TC 9 “Instruments for measuring mass,” respectively. A major discussion topic at the CPR meeting was whether to allow data from manufacturers’ test laboratories (obtained under “unsupervised” conditions) as part of the MAA process. While this issue was not resolved at the CPR meeting, a way of possibly moving forward was developed. The CPR members have been queried to better understand the minimum requirements they would have for assessing the impartiality of manufacturers’ test labs (MTLs), as well as the minimum requirements that an MTL must meet so that those MTLs that were excluded would not have a basis for complaint. CPR members have also been queried on their view of a possible compromise, where a minimum requirement on “frequency of supervision” of an MTL could be established. Comments from the CPR members were due by February 28, 2010. Another discussion topic at the CPR meeting was whether to accept laboratories in three countries into the MAA program for OIML R 76 (non-automatic weighing instruments) and OIML R 60 (load cells). These three countries were approved, and this is anticipated to soon lead to a significant increase in the number of OIML MAA Certificates that are issued for these instruments. During the Annual Meeting, Dr. Ehrlich gave an update of current international activities. Plans to revise the OIML B 3 and B 10 documents are proceeding (the present revision will not incorporate the inclusion of test data from MTLs into B 10, but will keep it in B 3). It has recently been clarified by a TC 3/SC 5 Member who wants to include test data from MTLs into B 10 that the data is not obtained under “unsupervised” conditions, but rather under conditions of “controlled supervision,” meaning that, at a minimum, 1) a thorough review of the manufacturer’s quality system has been performed; 2) the manufacturer has an independent testing laboratory that reports to the highest management level of the organization; 3) the Issuing Authority must be notified before any type approval tests are begun; 4) the Issuing Authority must be allowed to observe any and all testing on a short-notice basis; 5) the Issuing Authority is entitled to repeat any tests that it deems necessary, either at the manufacturing facility or at its own laboratory, at the manufacturer’s expense; plus 6) possibly other requirements. In addition, the Issuing Authority (Issuing Participant) would take all responsibility for any test data it obtained from the manufacturer. It would not be required, however, that the Issuing Authority be present at the MTL for all of the testing. The NCWM has already determined that NTEP will not accept test data from manufacturers unless there is an Issuing Authority representative on-site at the manufacturer’s site to supervise 100 % of the testing. 500-3 I NTEP Participating Laboratories and Evaluations Reports Background: During the 2009 NCWM Annual Meeting, Mr. Truex, NTEP Administrator, updated the Committee on NTEP laboratory and administrative activities. The NTEP weighing and measuring laboratories held a joint meeting March 31 - April 2, 2009, in Reynoldsburg, Ohio. The NTEP weighing laboratories also met in August 2009, prior to the meeting of the Weighing Sector in Columbus, Ohio. The NTEP measuring laboratories met again in October 2009, prior to the Measuring Sector meeting in Clearwater Beach, Florida. During the Interim Meeting, NTEP Administrator Mr. Truex, reported that incoming applications remain strong and all labs are busy. He reported there is no backlog concern for measuring devices, but three of the brick and mortar weighing labs still report about a two to three month backlog. However, the number of outstanding applications and evaluations in process is in a downward trend. The Committee noted that NTEP is maintaining a very active business.
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Following Datasheets	10-ntep-2011-annual-final (18 pages) 10-ntep-app-a-09-annual-final (20 pages) 10-ntep-app-a-11-pub15-final (28 pages) 10-ntep-app-a-grain-10-annual-final (30 pages) 10-ntep-app-b-09-annual-final (38 pages) 10-ntep-app-b-11-annual-final (46 pages) 10-ntep-app-b-11-pub15-final (46 pages) 10-ntep-app-b-meas-10-annual-final (96 pages) 10-ntep-app-c-09-annual-final (51 pages) 10-ntep-app-c-11-annual-final (30 pages)
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